Crack analysis in bimaterial interfaces using T-spline based XIGA

Analysis-suitable T-splines are used for the modeling and analyzing of cracks in bimaterial interfaces within the framework of an extended isogeometric analysis (XIGA). The crack tip enrichment functions of bimaterial interface cracks are implemented to reproduce singular fields, and the signed distance functions are used to treat the crack face and the interface in the models. A compatible local refinement algorithm is applied to refine location of the crack and the interface, which helps one to avoid produce excessive propagation of control points. The mixed mode stress intensity factors (SIFs) which are evaluated by the interaction integral (M-integral) are used as analysis parameters. Numerical simulations are performed to analyze the problem and to examine the efficiency of the proposed method. The obtained results are compared with other available results.

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eISSN:	2543-6309
ISSN:	1429-2955